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Rutherford backscattering analysis of multilayered CrNi structures to be used for sputtering standards

✍ Scribed by Donald G. Simons; Matt D. Brown; Joseph Fine; Tim D. Andreadis; Boris Navinšek


Publisher
Elsevier Science
Year
1983
Weight
291 KB
Volume
218
Category
Article
ISSN
0167-5087

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