RTN assessment of traps in polysilicon cylindrical vertical FETs for NVM application

✍ Scribed by de Andrade, Maria Glória Caño; Toledano-Luque, María; Fourati, Fatma; Degraeve, Robin; Martino, João Antonio; Claeys, Cor; Simoen, Eddy; Van den Bosch, Geert; Van Houdt, Jan

• Book ID: 123444106
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 807 KB
• Volume: 109
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2013.03.019