RTE measurement with Xe52+ ions channeled in a Si crystal

✍ Scribed by S. Andriamonje; M. Chevallier; C. Cohen; N. Cue; D. Dauvergne; J. Dural; R. Genre; Y. Girard; R. Kirsch; A. L'Hoir; J.C. Poizat; Y. Quéré; J. Remillieux; D. Schmaus; M. Toulemonde

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 672 KB
• Volume: 164
• Category: Article
• ISSN: 0375-9601
• DOI: 10.1016/0375-9601(92)90700-v