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Roughness-induced variation of magnetic anisotropy in ultrathin epitaxial films: The undulating limit

✍ Scribed by Vaz, C. A. F.; Steinmuller, S. J.; Bland, J. A. C.

Book ID
121448109
Publisher
The American Physical Society
Year
2007
Tongue
English
Weight
106 KB
Volume
75
Category
Article
ISSN
1098-0121

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## Abstract We have grown by molecular beam epitaxy (MBE) 300 Γ… Fe films on single crystal MgO(001) substrates with Ag buffer layer with a thickness varying from 0 to 150 Γ…. The epitaxial growth and structure quality of the films were verified by reflection high‐energy electron diffraction (RHEED)