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Roughness analysis of lithographically produced nanostructures: off-line measurement and scaling analysis

โœ Scribed by George P. Patsis; Vasilios Constantoudis; Angeliki Tserepi; Evangelos Gogolides; Grozdan Grozev; Thomas Hoffmann


Book ID
114155528
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
266 KB
Volume
67-68
Category
Article
ISSN
0167-9317

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