The interface separating two-dimensional phases close to a critical point is observed in the ferroelectric BaZrxTi~ \_ xO3 by transmission electron microscopy. The temperature dependence of the interfacial thickness is determined and compared with theoretical predictions.
โฆ LIBER โฆ
Roughening of quasicrystal interface in two dimensions
โ Scribed by Filip Babalievski; Andrey Milchev
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 228 KB
- Volume
- 80
- Category
- Article
- ISSN
- 0038-1098
No coin nor oath required. For personal study only.
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