Room-temperature stability study in silicon base magnetic tunneling transistor

✍ Scribed by Huang, Y.W.; Lo, C.K.; Yao, Y.D.; Hsieh, L.C.; Huang, D.R.

• Book ID: 114650716
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 150 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2005.855293