Silicon light-emitting diodes based on d
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Kveder, V. ;Badylevich, M. ;Schröter, W. ;Seibt, M. ;Steinman, E. ;Izotov, A.
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Article
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2005
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John Wiley and Sons
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English
⚖ 159 KB
## Abstract We investigated correlation between concentration of deep level defects at dislocations, detected by deep level transient spectroscopy (DLTS) and the efficiency of dislocation related luminescence in Si samples with dislocation density of about (3–5) × 10^8^ cm^–2^. We show that signifi