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Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates

✍ Scribed by S. Monéger; A. Tabata; C. Bru; G. Guillot; A. Georgakilas; K. Zekentes; G. Halkias


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
332 KB
Volume
21
Category
Article
ISSN
0921-5107

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