## Abstract We review the use of the contactless methods of photoreflectance (PR), contactless electroreflectance (CER) and wavelength modulated differential surface photovoltage spectroscopy (DSPS) for the nondestructive, room temperature characterization of a wide variety of wafer‐scale III–V sem
Room temperature characterisation of InGaAlAs quantum well laser structures using electro-modulated reflectance and surface photovoltage spectroscopy
✍ Scribed by Fox, Natasha E. ;Sharma, Tarun K. ;Sweeney, Stephen J. ;Hosea, T. J. C.
- Book ID
- 105365332
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 513 KB
- Volume
- 206
- Category
- Article
- ISSN
- 0031-8965
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✦ Synopsis
Abstract
In this study, two tri‐metal quaternary InGaAlAs quantum well (QW) laser structures grown on InP are compared to a conventional InGaAsP QW structure, also grown on InP, all designed to lase at 1.55 μm. Several spectroscopic methods are used to study the samples including surface photo‐voltage (SPV) and electro‐modulated reflectance (ER). In the tri‐metal samples the ground‐ and two excited‐state QW transitions are detectable in both types of spectroscopy. The SPV and ER give results in agreement to within a few meV of each other. By comparing the position of the measured QW transitions with those predicted theoretically, the conduction band offsets of the tri‐metal samples can be determined and compared to that in the InGaAsP sample. It is found that the tri‐metal samples have a much larger conduction band offset of ∼66% compared to the ∼40% in the InGaAsP sample. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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