𝔖 Bobbio Scriptorium

✦ LIBER ✦

Role of reliability and accelerated testing in VHSIC technology: Sushil K. Malik IEEE Trans. Components Hybrids mfg Technol. (CHMT-5 (1), 138 (1982)

Book ID: 104157391
Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 102 KB
Volume: 16
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(85)80248-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Role of reliability and accelerated test

Role of reliability and accelerated testing in VHSIC technology : Sushil K. Malik. IEEE Trans. Components Hybrids mfg Technol.CHMT-5 (1), 138 (1982)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 129 KB

Accelerated life testing and reliability

Accelerated life testing and reliability of high K multilayer ceramic capacitors : William J. Minford. IEEE Trans. Components Hybrids mfg Technol.CHMT-5 (3), 297 (1982)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 220 KB

Aspects of accelerated ageing tests used

Aspects of accelerated ageing tests used on connectors and terminals for the U.K. external telephone network : B. Wiltshire. IEEE Trans. Components Hybrids mfg Technol.CHMT-6 (1), 21 (1983)

📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 124 KB

An evaluation of palladium and palladium

An evaluation of palladium and palladium silver alloy in a dual-in-line package switch : W. Robert Hain, Judith A. Clisura and L. William Rudloff. IEEE Trans. Components Hybrids mfg Technol.CHMT-5 (1), 16 (1982)

📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 134 KB