The effect of relative humidity on frict
β
Yasuhisa Ando
π
Article
π
2000
π
Elsevier Science
π
English
β 580 KB
The friction and pull-off forces were measured between atomic force microscope AFM probe and submicron-size asperity arrays on Ε½ . a silicon wafer in various relative humidities. First, a focused ion beam FIB was used to produce two-dimensional arrays in which asperities were arranged at uniform int