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Role of Microstructure in Hertzian Contact Damage in Silicon Nitride: II, Strength Degradation

✍ Scribed by Seung Kun Lee; Brian R. Lawn


Book ID
110827510
Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
576 KB
Volume
81
Category
Article
ISSN
0002-7820

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