Role of film thickness on the properties of ZnO thin films grown by sol-gel method
β Scribed by Kumar, Vinod; Singh, Neetu; Mehra, R.M.; Kapoor, Avinashi; Purohit, L.P.; Swart, H.C.
- Book ID
- 123009847
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 948 KB
- Volume
- 539
- Category
- Article
- ISSN
- 0040-6090
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The present study focused on ZnO thin films fabricated by sol-gel process and spin coated onto Si (1 0 0) and quartz substrates. ZnO thin films have a hexagonal wu Β¨rtzite structure with a grain diameter about 50 nm. Optical properties were determined by photoluminescence (PL) and absorption spectro
Nanostructured ZnO thin films were deposited on Si(1 1 1) and quartz substrate by sol-gel method. The thin films were annealed at 673 K, 873 K, and 1073 K for 60 min. Microstructure, surface topography, and water contact angle of the thin films have been measured by X-ray diffractometer, atomic forc