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Role of carrier depletion effects and material properties in advanced microscale thermal modeling of N-GaInP–Si/p-GaAs–C heterojunction bipolar transistor (HBT) devices

✍ Scribed by Satbir S Madra


Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
833 KB
Volume
44
Category
Article
ISSN
0026-2714

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