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Robust trapped-ion quantum logic gates by continuous dynamical decoupling

✍ Scribed by Bermudez, A.; Schmidt, P. O.; Plenio, M. B.; Retzker, A.


Book ID
120661291
Publisher
The American Physical Society
Year
2012
Tongue
English
Weight
550 KB
Volume
85
Category
Article
ISSN
1050-2947

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