Robust testing of CMOS logic circuits : Niraj K. Jha. Comput. Electr. Engng 15(1), 19 (1989)

• Book ID: 103285512
• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 127 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90488-9