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Robust reliability design using environmental stress testing

✍ Scribed by Kai Yang; Guangbin Yang


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
129 KB
Volume
14
Category
Article
ISSN
0748-8017

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✦ Synopsis


This paper presents a strategy for improving reliability by using a robust design method. In this approach, reliability is related to performance degradation and several reliability models are developed to address performance degradation. This robust design strategy integrates orthogonal array experiments with environmental stress testing. Its goal is to select optimal levels of design parameters such that the product performance will be less sensitive to environmental stresses and thus more reliable. This method is applied to the design of an IC wirebonding process and a comparison shows that the products produced with optimum design parameters are more robust and reliable under environmental stresses.


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