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Robust partial least squares regression—part III, outlier analysis and application studies

✍ Scribed by Uwe Kruger; Yan Zhou; Xun Wang; David Rooney; Jillian Thompson

Publisher: John Wiley and Sons
Year: 2008
Tongue: English
Weight: 347 KB
Volume: 22
Category: Article
ISSN: 0886-9383
DOI: 10.1002/cem.1124

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## Abstract Partial least‐squares (PLS) regression has been presented as a powerful tool for spectral quantitative measurement. However, the improvement of the robustness and stability of PLS models is still needed, because it is difficult to build a stable model when complex samples are analyzed o