𝔖 Bobbio Scriptorium
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Robust optimal solution to the attitude/force control problem

✍ Scribed by Sanchez Pena, R.S.; Alonso, R.; Anigstein, P.A.


Book ID
120641871
Publisher
IEEE
Year
2000
Tongue
English
Weight
366 KB
Volume
36
Category
Article
ISSN
0018-9251

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## Abstract The atomic force microscope (AFM) is a powerful tool for imaging and manipulating matter at the nanoscale. An optimal control problem is proposed for the control of AFMs which includes the design of a sample‐profile estimate signal in addition to the set‐point regulation and resolution