✦ LIBER ✦
Robust Ohmic contact junctions between metallic tips and multiwalled carbon nanotubes for scanned probe microscopy
✍ Scribed by Kim, Suenne; Kim, Jeehoon; Berg, Morgann; de Lozanne, Alex
- Book ID
- 120068993
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 873 KB
- Volume
- 79
- Category
- Article
- ISSN
- 0034-6748
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