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RMC: modelling neutron diffraction, X-ray diffraction and EXAFS data simultaneously for amorphous materials

✍ Scribed by J.D. Wicks; R.L. McGreevy

Book ID: 115990529
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 325 KB
Volume: 192-193
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(95)00324-x

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