Risk Factors and Prognosis of Atrioventricular Block After Atrial Septum Defect Closure Using the Amplatzer Device

✍ Scribed by Wang, Yibin; Hua, Yimin; Li, Li; Wang, Xiaoqin; Qiao, Lina; Shi, Xiaoqing; Hua, Jiping; Qu, Yi; Mu, Dezhi

• Book ID: 121543297
• Publisher: Springer
• Year: 2013
• Tongue: English
• Weight: 188 KB
• Volume: 35
• Category: Article
• ISSN: 0172-0643
• DOI: 10.1007/s00246-013-0822-1