Ring-dot impedance measurement, a simple technique for measuring inversion-layer conductance in semiconductors

✍ Scribed by Goetzberger, A.

• Book ID: 114588822
• Publisher: IEEE
• Year: 1965
• Tongue: English
• Weight: 386 KB
• Volume: 12
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1965.15466