✦ LIBER ✦
RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments
✍ Scribed by H.D. Yen; J.S. Yuan; R.L. Wang; G.W. Huang; W.K. Yeh; F.S. Huang
- Book ID
- 119326646
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 589 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0026-2714
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