Reverse DC bias stress shifts in organic thin-film transistors with gate dielectrics using parylene-C

✍ Scribed by Fukuda, Kenjiro ;Suzuki, Tatsuya ;Kumaki, Daisuke ;Tokito, Shizuo

• Book ID: 112181092
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 689 KB
• Volume: 209
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201228219