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Reverse DC bias stress shifts in organic thin-film transistors with gate dielectrics using parylene-C

โœ Scribed by Fukuda, Kenjiro ;Suzuki, Tatsuya ;Kumaki, Daisuke ;Tokito, Shizuo


Book ID
112181092
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
689 KB
Volume
209
Category
Article
ISSN
0031-8965

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