Reverse bias voltage decay and measurement of the dark current in semiconductor radiation detectors

✍ Scribed by D.H.J. Totterdell; S.C. Jain; J.W. Leake

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 650 KB
• Volume: 30
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(87)90172-9