Reverse bias stresses on emitter-base junctions : R. F. Haythornthwaite and R. E. Thomas. Proc. 1975 Canadian SRE Reliability Symp. Ottawa, p. 231, 10 May, 1975

• Publisher: Elsevier Science
• Year: 1975
• Tongue: English
• Weight: 126 KB
• Volume: 14
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(75)90070-0