✦ LIBER ✦
Reverse bias annealing of Schottky diodes: evidence for the lower defect density and better stability of polymorphous silicon compared to amorphous silicon
✍ Scribed by J.P Kleider; P Roca i Cabarrocas
- Book ID
- 117145490
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 246 KB
- Volume
- 299-302
- Category
- Article
- ISSN
- 0022-3093
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