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Retroreflecting ellipsometer for measuring the birefringence of optical disk substrates

✍ Scribed by Fu, Hong ;Goodman, T. ;Sugaya, S. ;Erwin, J. K. ;Mansuripur, M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A Novel Method for Measuring the Vertica

✍ Mansuripur, M. ;Hsieh, Yung-Chieh 📂 Article 📅 1994 🏛 The Optical Society 🌐 English ⚖ 951 KB

Measurement of the wavelength dependence

✍ Fu, Hong ;Yan, Zheng ;Mansuripur, M. 📂 Article 📅 1994 🏛 The Optical Society 🌐 English ⚖ 562 KB

Simple birefringence measurement method

✍ Horie, Michikazu 📂 Article 📅 1995 🏛 The Optical Society 🌐 English ⚖ 194 KB

Residual birefringence of amorphous poly

✍ Y. Shindo; M. Saito; Y. Iwatsuka; H. Hasegawa 📂 Article 📅 1991 🏛 John Wiley and Sons 🌐 English ⚖ 411 KB

Measuring distribution of the ellipsoid

✍ Fu, Hong ;Sugaya, Satoshi ;Mansuripur, M. 📂 Article 📅 1994 🏛 The Optical Society 🌐 English ⚖ 633 KB

Temperature dependence of the birefringe

✍ Goodman, Timothy D. ;Gerber, Ronald E. ;Mansuripur, M. 📂 Article 📅 1996 🏛 The Optical Society 🌐 English ⚖ 892 KB