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Retrieving the dielectric function of diamond from valence electron energy-loss spectroscopy

โœ Scribed by Zhang, L.; Erni, R.; Verbeeck, J.; Van Tendeloo, G.


Book ID
126876530
Publisher
The American Physical Society
Year
2008
Tongue
English
Weight
901 KB
Volume
77
Category
Article
ISSN
1098-0121

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Valence and Core Electron Energy Loss Spectroscopy (VEELS and CEELS) experiments are performed from nanocrystallized nickel silicide thin films. Three different silicide compounds are identified in the films. Their chemical compositions are determined from Ni-L(2,3) to Si-K core edges quantification