Retrieval of the Characteristics and Determination of the Parameters of Statistical Nanometer Surface Roughness using the Data on Scattering in a Planar Optical Waveguide in the Presence of Additive Noise

✍ Scribed by A. A. Egorov

• Book ID: 110396570
• Publisher: Springer US
• Year: 2002
• Tongue: English
• Weight: 194 KB
• Volume: 45
• Category: Article
• ISSN: 0033-8443
• DOI: 10.1023/a:1020532826709