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Retardation characteristics and birefringence of a multiple-order crystalline quartz plate

โœ Scribed by N.N. Nagib; S.A. Khodier; H.M. Sidki


Book ID
104159777
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
120 KB
Volume
35
Category
Article
ISSN
0030-3992

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โœฆ Synopsis


A crystalline quartz plate of thickness 1:070 mm is calibrated between 370 and 794 nm. Throughout this spectral interval, the retardance varied by 32 and the plate introduced quarterwave retardance 16 times at di erent wavelengths. The birefringence (ne -no) of crystalline quartz was calculated as a single quantity and varied from 0.00971 at 370 nm to 0.00891 at 794 nm. All measurements were carried out at 23 โ€ข C.


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