✦ LIBER ✦
Response to “Comment on ‘Broadening of metal-oxide-semiconductor admittance characteristics: Measurement, sources, and its effects on interface state density analyses’” [J. Appl. Phys. 112, 076101 (2012)]
✍ Scribed by Paterson, G. W.; Long, A. R.
- Book ID
- 121727477
- Publisher
- American Institute of Physics
- Year
- 2012
- Tongue
- English
- Weight
- 267 KB
- Volume
- 112
- Category
- Article
- ISSN
- 0021-8979
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