Design of a novel fault-tolerant voter c
โ
R.V. Kshirsagar; R.M. Patrikar
๐
Article
๐
2009
๐
Elsevier Science
๐
English
โ 386 KB
Due to the shrinking of feature size and significant reduction in noise margins, nanoscale circuits have become more susceptible to manufacturing defects, interference from radiation and noise-related transient faults. Many of these faults are not permanent in nature but their occurrence can result