Resonant X-ray diffraction of α-phase Mo0.15Ru0.85Si and crystal stability calculation in Mo–Ru–Si system (FeSi and CsCl types)

✍ Scribed by Ferhath Zamoum; Michel François; Janusz Tobola; Eric Elkaim; Michel Vilasi

• Book ID: 116574502
• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 668 KB
• Volume: 16
• Category: Article
• ISSN: 0966-9795
• DOI: 10.1016/j.intermet.2008.04.011