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Resonant tunneling characteristics in SiO2/Si double-barrier structures in a wide range of applied voltage

✍ Scribed by Ikeda, Hiroya; Iwasaki, Masanori; Ishikawa, Yasuhiko; Tabe, Michiharu


Book ID
118148443
Publisher
American Institute of Physics
Year
2003
Tongue
English
Weight
350 KB
Volume
83
Category
Article
ISSN
0003-6951

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