Resonant Raman Spectroscopy of Organic Semiconductors
β Scribed by R. Scholz; A.Yu. Kobitski; T.U. Kampen; M. Schreiber; D.R.T. Zahn; G. Jungnickel; Th. Frauenheim
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 106 KB
- Volume
- 221
- Category
- Article
- ISSN
- 0370-1972
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Micro-Raman spectroscopy allows one to measure stress in crystalline materials. The method is nondestructive and provides microscopic lateral resolution. In this paper we show that resonance excitation using an ultraviolet (UV) laser line strongly enhances the depth resolution in micro-Raman spectro
The development of the simplest variant of the semi-classical theory of the Raman e β ect (RE) resulted in the establishment of two main mechanisms of this phenomenon, favoured the formation of a new directionΓRaman line excitation spectroscopy, and stimulated the search for conditions of excitation