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Resonance-enhanced multiple-photon ionisation spectroscopy of excited sulphur atoms

โœ Scribed by T. V. Venkitachalam; A. S. Rao


Publisher
Springer
Year
1991
Tongue
English
Weight
777 KB
Volume
52
Category
Article
ISSN
0721-7269

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Excited electronic states of the SiF2 ra
โœ Russell D. Johnson III; Jeffrey W. Hudgens; Michael N.R. Ashfold ๐Ÿ“‚ Article ๐Ÿ“… 1996 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 504 KB

SiF 2 radicals have been produced by the gas-phase reaction of Sill 4 with F atoms in a flow reactor and detected by mass-resolved resonance enhanced multiphoton ionisation (REMPI) spectroscopy. Two band systems are observed. One, a series of one-photon resonances in the wavelength range 210-230 nm,