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Resonance depth profiling of low-Z elements with target biasing applied to the 3.045 MeV 16O(α, α)16O resonance

✍ Scribed by W. De Coster; B. Brijs; J. Goemans; W. Vandervorst

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Methodology for resonance depth profilin

✍ W. De Coster; B. Brijs; R. Moons; W. Vandervorst 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 366 KB

Depth profiling of light-Z elements with

✍ W. De Coster; B. Brijs; J. Goemans; W. Vandervorst 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 652 KB

Absolute calibration of the 16O(α,α)16O

✍ F.J.D. Almeida; J.A. Davies; T.E. Jackman 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 742 KB

Peculiarities of the 16O(α, α)16O 3.045

✍ V.I. Soroka; M.V. Artsimovich; I.Yu. Lobach; I.F. Mogilnik; V.N. Pavlovich; V.V. 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 779 KB

Hydrogen depth profiling using the 6.46

✍ K. Umezawa; A. Kitamura; S. Yano 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 854 KB

An explanation for the tilt-up in thick

✍ V.Andrew McGlone 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 223 KB