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Resolution tests of CsI(Tl) scintillators read out by pin diodes

✍ Scribed by W.G. Gong; Y.D. Kim; G. Poggi; Z. Chen; C.K. Gelbke; W.G. Lynch; M.R. Maier; T. Murakami; M.B. Tsang; H.M. Xu; K. Kwiatkowski


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
801 KB
Volume
268
Category
Article
ISSN
0168-9002

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