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Resolution improvement in vertical-cavity-surface-emitting-laser diode interferometry based on linear least-squares estimation of phase gradients of phase-locked fringes

✍ Scribed by Seiichi Kakuma; Yasuhiko Katase


Publisher
Optical Society of Japan
Year
2010
Tongue
English
Weight
256 KB
Volume
17
Category
Article
ISSN
1340-6000

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