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Resolution enhancement of nondestructive testing from B-scans

✍ Scribed by Hsin M. Shieh; Hsin-Chun Yu; Yu-Ching Hsu; Ruei Yu

Book ID: 115556588
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 911 KB
Volume: 22
Category: Article
ISSN: 0899-9457
DOI: 10.1002/ima.22021

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