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Resolution effect on the study of ductile damage using synchrotron X-ray tomography

✍ Scribed by C. Landron; E. Maire; J. Adrien; O. Bouaziz; M. Di Michiel; P. Cloetens; H. Suhonen

Book ID: 113823683
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 410 KB
Volume: 284
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2011.08.069

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