Resistive Switching: Real-Time Observation on Dynamic Growth/Dissolution of Conductive Filaments in Oxide-Electrolyte-Based ReRAM (Adv. Mater. 14/2012)

✍ Scribed by Qi Liu; Jun Sun; Hangbing Lv; Shibing Long; Kuibo Yin; Neng Wan; Yingtao Li; Litao Sun; Ming Liu

• Book ID: 111992541
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 284 KB
• Volume: 24
• Category: Article
• ISSN: 0935-9648
• DOI: 10.1002/adma.201290080