Resistive switching effects in single metallic tunneling junction with nanometer-scale gap

✍ Scribed by Mizukami, Takahiro; Miyato, Yuji; Kobayashi, Kei; Matsushige, Kazumi; Yamada, Hirofumi

• Book ID: 120385725
• Publisher: American Institute of Physics
• Year: 2011
• Tongue: English
• Weight: 505 KB
• Volume: 98
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3559612