✦ LIBER ✦
Resistance-dependent field effect on the radiation behavior of MOS capacitors examined by instantaneous-terminal-voltage technique
✍ Scribed by Jenn-Gwo Hwu; Shyh-Liang Fu
- Book ID
- 107814798
- Publisher
- Elsevier Science
- Year
- 1990
- Tongue
- English
- Weight
- 851 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0022-3697
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