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Resistance decay after electromigration as the effect of mechanical stress relaxation

✍ Scribed by G.L. Baldini; A. Scorzoni; F. Tamarri

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 258 KB
Volume: 33
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(93)90089-h

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