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Resistance creep of Allen-Bradley resistors at low temperatures

โœ Scribed by E.M. Forgan; S. Nedjat


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
143 KB
Volume
21
Category
Article
ISSN
0011-2275

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๐Ÿ“œ SIMILAR VOLUMES


Creep of niobium at low temperatures
โœ G.A Stone; H Conrad ๐Ÿ“‚ Article ๐Ÿ“… 1964 ๐Ÿ› Elsevier Science โš– 534 KB

The activation energy, H, the activation volume, w\*, and the frequency factor, Y, for the plastic deformation of niobium at low temperatures (T < 0.2 T,) were derived from creep tests. The values of H and e\* for r\* = 1 kg/mm2 were 0.75 eV and 47bS respectively, decreasing with increase in stress.