✦ LIBER ✦
Resistance changes due to Cu transport and precipitation during electromigration in submicrometric Al-0.5% Cu lines
✍ Scribed by A. Scorzoni; I. De Munari; R. Balboni; F. Tamarri; A. Garulli; F. Fantini
- Book ID
- 103286587
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 289 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.